Measurement of Cotton Maturity and Fineness by a Vis/NIR Reflectance HVI. Part II. Data Analysis Results

Steven M. Buco and Joseph G. Montalvo, Jr.


Past research has indicated that nondestructive VIS/NIR reflectance spectroscopy using a NIRSystems Model 6500, 400 to 2500 nm range, measures the fundamental fiber properties of wall thickness and perimeter. The instrument requires 26 seconds to measure a sample. The current study evaluates a fast KES diode-array instrument, 400 to 1700 nm range, which can acquire a sample spectra in 1.3 seconds. Overall, the results of the diode-array instrument indicate that the spectrophotometer came close to matching the precision of the calibration techniques, although there remains some room for improvement. The goal is to produce precise cotton quality measurements by a simple, practical, and fast approach.

Reprinted from Proceedings of the 1994 Beltwide Cotton Conferences pp. 1476 - 1477
©National Cotton Council, Memphis TN

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Document last modified Sunday, Dec 6 1998