A new strain of the Sweet Potato Whitefly, Bemisia tabaci (Genn.), has caused economic damage in US agriculture since 1986. In Texas, cotton was heavily damaged in 1991, prompting new investigations into whitefly control options. Incorporation of host plant resistance mechanisms into commercial cotton cultivars will form the basis of IPM for the Sweet Potato Whitefly. Possible resistance mechanisms have bee identified, including leaves with fewer trichomes, okra leaf shape, red plant color, and leaf pH. Research has been initiated to determine the effects of leaf trichomes and pH on host selection by the Sweet Potato Whitefly. Leaf surface pH, internal leaf pH, and leaf trichome density were evaluated for eighteen genotypes under greenhouse conditions. Choice tests were conducted in the greenhouse, with infestation levels sampled by a leaf disk method. Results to date indicate that leaf surface pH method. Results to date indicate that leaf surface Ph is not a resistance mechanism, but results tend to verify that smoother leaves impart a degree of resistance, at least in the genetic backgrounds studied.