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Analysis of Cotton Maturity And Fineness by Multiple NIR HVIs Part I: Data Analysis

S. M. Buco, J. G. Montalvo, Jr. and S. E. Faught


Past research has indicated that a nondestructive VIS/NIR diode-array HVI measures the fundamental fiber properties of wall thickness and perimeter on blended cottons with precision equal to the primary methods used to calibrate the diode-array HVI. In this study, an improved Micromat model of the FMT is used as the reference to calibrate two diode-array HVIs for use on unblended, raw cottons and blended cottons.

Reprinted from Proceedings of the 1998 Beltwide Cotton Conferences pp. 1623 - 1625
©National Cotton Council, Memphis TN

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Document last modified Sunday, Dec 6 1998