Yield mapping is a critical aspect of a precision management approach to farming. Crop yield is an important feedback parameter when attempting to optimize production inputs on a less than field size basis. However, knowledge of yield variability patterns are not enough to implement a precision management system. Parameters that cause variability should also be measured. No cotton yield mapping systems have been available commercially, but development is underway. Cotton producers, advisors and researchers will be affected by the availability of cotton yield mapping systems, and should prepare for the wide spread availability of such systems.